Last modification

21st of February 2019

Irradiation damage tests of backside-illuminated CMOS APS prototypes for the Extreme Ultraviolet Imager on-board Solar Orbiter



A. BenMoussa, S. Gissot, B. Giordanengo, G. Meynants, X. Wang, B. Wolfs, J. Bogaerts, U. Schühle, G. Berger, A. Gottwald, C. Laubis, U. Kroth, F. Scholze, A. Soltani, and T. Saito. IEEE Trans. Nucl. Sci., vol 60 (5), pp 3907-3914, 2013.