Last modification

18th of April 2017

Irradiation damage tests of backside-illuminated CMOS APS prototypes for the Extreme Ultraviolet Imager on-board Solar Orbiter

A. BenMoussa, S. Gissot, B. Giordanengo, G. Meynants, X. Wang, B. Wolfs, J. Bogaerts, U. Schühle, G. Berger, A. Gottwald, C. Laubis, U. Kroth, F. Scholze, A. Soltani, and T. Saito. IEEE Trans. Nucl. Sci., vol 60 (5), pp 3907-3914, 2013.