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18th of April 2017

Characterization of AlN metal-semiconductor-metal diodes in the spectral range 44-360 nm: Photoemission assessments



A. BenMoussa, J.F. Hochedez, R. Dahal, J. Li, J. Y. Lin, H. X. Jiang, A. Soltani and J.-C. De Jaeger, U. Kroth and M. Richter.
Appl. Phys. Lett. 92, 22108 (2008)